Abstract
Uncertainty analysis is a research hotspot in the field of electromagnetic compatibility (EMC) simulation. The stochastic collocation method (SCM) is considered particularly suitable for uncertainty analysis in the EMC field because it is characterized by a high level of computational efficiency and accuracy while requiring no replacement solver. However, the post-processing process of the SCM is too complex, which will seriously limit its application in many industrial environments such as real-time simulation analysis. Multi-element grid (MEG) is a novel uncertainty analysis method recently for successful application in another area. It is proved that its calculation accuracy is same as the SCM, and its post-processing process is facile. This paper introduces the MEG to the EMC field and makes a detailed comparison between it and the SCM in performance, aiming to apply uncertainty analysis to solve more practical EMC engineering problems.
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