Abstract
This paper proposes a lifting wavelet model for enhancement of accuracy of surface roughness characterisation. In this work, the theory and fast algorithm of the lifting wavelet are briefly introduced and a lifting wavelet model for extraction of roughness of surfaces has been developed. The rough surface recovered has good refinement accuracy in contrast to the least squares polynomial fitting. Applications are conducted by using a series of typical surfaces, planes and curves, measured by contact (stylus) and non-contact (phase-shifting interferometry) instruments, to demonstrate the feasibility and applicability of using the lifting wavelet model in the analysis of these surfaces.
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