Application of the glow discharge mass spectrometry (GDMS) for the multi-element trace and ultratrace analysis of sputtering targets

Abstract

Glow discharge mass spectrometry using a VG9000 high resolution mass spectrometer has been applied to both the multi-element trace and ultra trace analyses of sputtering target materials, i.e. aluminium-based alloys, cobalt-based alloys, titanium and platinum. Element dependent relative sensitivity factors (RSF) have been determined using reference materials in order to provide the possibility for quantitative analyses. Aluminium-based and cobalt-based alloys have been extensively analysed to demonstrate precision of GDMS analyses. Detection limits in the ng/g and sub-ng/g ranges, i.e. 0.2 ng/g for U and Th have been determined in aluminium-based alloys. Comparative analyses for alloy components in cobalt-based alloys as well as trace concentrations in titanium have been performed. GDMS has been also applied to multi-element depth profile analyses in contaminated and noncontaminated platinum targets.