Abstract
Additive manufacturing (AM) is a rapidly expanding material production technique that brings new opportunities in various fields as it enables fast and low-cost prototyping as well as easy customisation. However, it is still hindered by raw material selection, processing defects and final product assessment/adjustment in pre-, in- and post-processing stages. Spectroscopic techniques offer suitable inspection, diagnosis and product trouble-shooting at each stage of AM processing. This review outlines the limitations in AM processes and the prospective role of spectroscopy in addressing these challenges. An overview on the principles and applications of AM techniques is presented, followed by the principles of spectroscopic techniques involved in AM and their applications in assessing additively manufactured parts.
Highlights
Additive manufacturing (AM), commonly known as 3D printing, is a process of fabricating 3-dimensional objects through layer-by-layer addition, directly from a digital file
This paper aims to provide a comprehensive review of spectroscopic techniques currently employed and future prospective as material characterisation tools in AM
AM techniques summarised In fused deposition modelling (FDM), a thermoplastic filament is fed to the heated printer head and molten polyplastic filament extrusion, photo polymerisation, melt deposition, ceramic suspension mer is extruded through the nozzle to create a thin layer of the desired shape on a platdeposition or lamination
Summary
Additive manufacturing (AM), commonly known as 3D printing, is a process of fabricating 3-dimensional objects through layer-by-layer addition, directly from a digital file. Raw materials have been applied to detect defects in additively manufactured parts [18].measurements, Raw materials X-ray comhave been characterised using laser particle size distribution have been characterised using laser size scanning distribution measurements, X-ray com- elemental puted tomography, X-rayparticle diffraction, electron microscopy, dispersive puted tomography, X-ray diffraction, scanning electron microscopy, dispersive elemental analysis [13] These techniques have fallen short of providing information on analysis [13]. The specific aims of this review are: (i) To summarise the principles, production techniques and materials used in AM; (ii) to provide the principles of spectroscopic techniques; (iii) to outline the scientific and technical challenges in AM and the potential functionality of spectroscopy in the AM process
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