Abstract
A description is given of the first application to LEED crystallographic problems of an optimization scheme called orthogonal experimental design (OED) which economizes on selection of trial values. The operational procedures required by the OED method are described, and their use in a LEED intensity analysis of the Si{001}2×1 surface is discussed. This first application to what is undoubtedly one of the most difficult problems in quantitative LEED crystallography was an essential ingredient in finding a satisfactory set of structural parameters for the Si{001}2×1 surface.
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