Abstract
Cubic and hexagonal GaN thin films are studied using the angular dependence of the near-edge x-ray absorption fine structure (NEXAFS) spectra recorded at the N–K edge. It is shown that the energy positions of the NEXAFS resonances are characteristic of the cubic and hexagonal structures and, thus, the NEXAFS spectra can be used as a fingerprint of the symmetry of the examined crystal. Deviations from the zinc-blende or wurtzite phases are clearly detectable since they lead to a systematic energy shift in the NEXAFS resonances. Finally, a method is proposed for the quantitative estimation of the percentages of the cubic and wurtzite phases present in a mixed crystal.
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