Abstract
In the recent years atomic force microscopy is recognized as valuable tool for investigation of surficial features of construction materials. It concerns, among other things, studies of changes caused by such phenomena as galvanic corrosion, passivation associated with the growth of oxide layers, or sensitization of austenitic steels with the formation of carbide phases. In addition, atomic force microscopy allows easy coupling with impedance technique which is especially promising because of its versatility in investigations of both conductive and dielectric materials. The authors discuss the possibility of application of such type of measurement, known as impedance microscopy. Copyright © 2015 John Wiley & Sons, Ltd.
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