Abstract
A novel direct technique for measuring the ion optical characteristics of systems used for the focusing, selection, transportation, energy analysis and mass-separation of ion beams is proposed. This method is based on detecting the light (350–600 nm) emitted because of decay ( τ≈10 −5s) of the metastable excited ions produced by electron-atom collisions. We found that the beam trajectories formed by such ions are visible in free space as well as in electric or magnetic fields under UHV conditions. Some widely employed ion optical elements have been investigated by using the proposed method. For example, our measurements of the focal length, the location of the principal plane, and the aberrations of well-known symmetrical electrostatic lenses are in agreement with computer calculations. This technique may be useful for ion optical characteristics studies and practical designs of ion beam equipment.
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Schedule a callMore From: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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