Application of handheld X-ray fluorescence spectrometer for major element analysis and characterization of geological samples in Southern Thailand

Abstract

The handheld X-ray fluorescence spectrometer (hXRF) was applied to major element analysis in the geological samples and the results were compared with the results of the wavelength dispersive X-ray fluorescence spectrometer (WDXRF). In addition, the analytical compositions were confirmed by X-ray diffractometer (XRD) and scanning electron microscopy with energy dispersive X-ray spectroscopy (SEM-EDX). In the case of pXRF analysis, eight geological reference materials were used to calibrate the analytical method and four known concentration samples were used to prove the method. In research, ten geological samples from Phuket province, Thailand were collected with different depths corresponding to O horizon (0-0.1 m), A horizon (0.1-0.3 m), B1 horizon (0.3-1.0 m), B2 horizon (1.0-2.0 m), C1 horizon (2.0-3.0 m), C2A horizon (3.0-5.0 m), C2B horizon (5.0-8.0 m), C3 horizon (8.0-12.0 m), D horizon (12.0-20.0 m) and RK horizon (> 20.0 m). The elemental analysis results showed that the pXRF results were matched well with that WDXRF results. The concentration range in ten samples were Si (18-22 wt%), Al (12-15 wt%), Fe (1-4 wt%), K (0.4-3.2 wt%) and Ti (0.2-0.4 wt%). The concentration of some elements such as Ca and Mg on those ten samples are low and they are unable to analysed by hXRF. The XRD patterns revealed that all samples consisted of quartz, kaolinite, halloysite, illite, vermiculite and biotite.