Abstract
Wavelength dispersive and energy dispersive x-ray fluorescence spectrometers are compared. Separate sections are devoted to principles of operation, sample excitation, spectral resolution, and x-ray detection. Tabulated data from the literature are cited in the comparison of accuracy, precision, and detection limits. Spectral interferences and distortions are discussed. Advantages and limitations are listed for simultaneous wavelength dispersive spectrometers, sequential wavelength dispersive spectrometers, and Si(Li) energy dispersive spectrometers. Accuracy, precision, and detection limits are generally superior for wavelength dispersive spectrometers.
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