Abstract
Dynamic Background Subtraction (DBS) involves multiple differentiation followed by multiple integration of some experimental variable. The technique is applied to Auger electron and soft X-ray appearance potential spectroscopies to remove large background signals allowing one to make meaningful quantitative comparisons from such data. It is found that double differentiation of electron current distributions followed by double integration is sufficient to remove backgrounds in these studies. Using DBS, the predicted quadratic dependence of Auger signal strength with modulation amplitude for second derivative current detection in a four-grid retarding potential analyzer is experimentally verified over a large range of modulation amplitude.
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