Abstract
Abstract Chemical effects in X-ray spectra (energy shifts, emission probability changes, satellite formation and peak profile changes) may be used for characterization of the chemical circumstances and chemical bonding of the monitored element in the sample. For that purpose, an investigation of the chemical effects in ion induced X-ray spectra of the high- T c superconductor materials Sr 2 Ln y Ce 0.5 TaCu 2 O 10+ δ ( Ln =Eu,Sm) was carried out using a high resolution crystal X-ray spectrometer. The applicability of the chemical effects for the mapping of the crystal phases in the superconductor sample using an ion microbeam is discussed.
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