Abstract
A technique for characterization of intermodulation performance of unpatterned high TC superconducting (HTS) films, based on the application of the resonator with a single coupling probe is proposed. It allows us to sufficiently increase the sensitivity in comparison with the conventional method based on the resonator with two coupling probes. The measurements of the power at mixed frequency as a function of input power are performed for epitaxial HTS films of various surface resistance and thickness. From the experimental data an intermodulation coefficient α is determined, which provides the film intermodulation properties independently on the measuring system.
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