Abstract
The present work reports the development of a method for measurement of sub-micrometer displacements due to the thermal response of printed circuit boards.The developed system employs Electronic Speckle Pattern Interferometry in three dimensions, obtaining three orthogonal displacements of the specimen’s surface from the resulting phase maps. Afterwards, the displacements are corrected, removing the rigid rotation of the physical support and the relative rotation between the two regions of interest is calculated.This method provides a very high-resolution displacement measurement tool, which is very important, for example, in the design phase of outdoor surveillance cameras to optimize image quality.
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