Abstract
Appearance of ferroelectricity has been predicted in the SxSe1-x (x=0.08-0.18) single crystalline films (thickness below 5 nm) using quantum chemical and molecular dynamics simulations. Direct measurements of the spontaneous polarization show appearance of the ferroelectricity for the film thickness below 5 nm with sulfur content × = 0.10-0.30. Inelastic neutron scattering and Raman measurements confirms substantial role of electron-phonon anharmonicity in the observed ferroelectric phase transition
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