Abstract

High-sensitivity space-resolved measurements of the number density of neutral free radicals in reactive plasmas have been accomplished by appearance mass spectrometry. This technique is based on several electron volts difference among the appearance potentials for electron-impact ionization. First, some difficulties accompanied with the appearance mass spectrometry are considered, especially on the influence of excited parent molecules and radical sticking. Second, spatial distributions of neutral radical CH3 and CH2 in a parallel plate rf discharge of methane at a pressure of 0.01–0.3 Torr have been measured. The results are well described by a one-dimensional numerical modeling whose input parameters are provided by comprehensive measurements of electron energy distribution, ionic composition, and radical sticking coefficients. Third, the density distributions of CF3 and CF2 radicals in a fluorocarbon etching plasma at a CF4 pressure of 0.01–0.2 Torr have been measured. Finally, several applications of the appearance mass spectrometry to investigations of radical collision processes in gas phase and on solid surfaces are reported, e.g., cross section measurements for electron-impact dissociation of methane into CH3 and CH2 radicals.

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