Abstract
We focus the apparent contrast of water islands formed at ionic crystal surfaces in air at room temperature (RT) using the non-contact monitoring mode of a scanning force microscope (SFM). Their apparent heights of water islands formed on LiF(001), CaF 2(111) and BaF 2(111) surfaces have been measured to be about 2, 1 and 1 nm, respectively. The water growth of a NaF(001) surface has two phases (phase I and phase II). The apparent heights of phase I and phase II have been measured to be about 2 and 1.5 nm, respectively. The apparent height of water films is shown to be strongly modified by the dielectric constant of sample and water, and the true thickness of water islands is discussed.
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