Abstract
Finding 2D and thin‐film layered materials have become essential to develop not only in scientific‐related fields, but also in a wide industry, which is constantly feeding from this progress. For electronic devices, thin‐film materials are supposed to be a step forward to overcome Moore's law. In many other technologic areas, the development of tools based on flakes of materials has found new physics, becoming a rising field. Although, destructive techniques are commonly used to characterize the thickness of these materials. Herein, a list of materials is presented, whose thicknesses are characterized by their apparent colors in several substrates, a harmless, fast, and reliable technique that has been already used to determine the number of layers in several works. This list is also enlarged with other materials and substrates.
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