Abstract
A single beam device which measures continuously as a function of wavelength reflectance and transmittance is described. The unit is attached to a McPherson 218 monochromator, but it can be adapted for any monochromator. A notable feature of the device is that with a specially constructed vacuum evaporator this system enables the study of the optical properties of thin films without exposing them to air. Described also is a feedback light control system designed to compensate for signal intensity variations with wavelength caused by various optical components.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
