Abstract
An optimum design of an antireflective (AR) coating for a spherical Si solar cell with a reflector cup has been analyzed with a three-dimensional (3D) ray-tracing simulation. The 3D ray tracing is required to estimate the short-circuit current density (Jsc) because of an incident light angle distribution on a solar cell surface. In the simulation, the solar cell consists of a spherical Si solar cell with a diameter of 1 mm covered by an AR coating without surface texturing, and a hemispherical reflector cup with an aperture of 2 mm. The calculations of AR coating thickness (t) and refractive index (n) dependences on Jsc revealed that an optimum Jsc of 39.7 mA/cm2 can be obtained at t=78 nm and n=2.0. Also, a higher design tolerance in an optical film thickness of the AR coating is demonstrated, which is especially advantageous for spherical Si solar cells which inherently have some technical difficulties in a uniform AR coating formation.
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