Abstract

Antimony bismuth alloy films were deposited on Si and K9 glass substrates by magnetron-control sputtering method. The structure of the film was studied with x-ray diffraction (XRD). The thermal property of the film was researched by differential scanning calorimetry (DSC). The optical constants of the films including refractive index (n) and extinction coefficients (k) are measured by ellipsometry, and the dielectric constants (=r+ii), absorption coefficients  were also calculated.

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