Abstract
Copper-doped diamond-like carbon (Cu-DLC) film was deposited using dual magnetron sputtering to develop an antimicrobial coating. The Cu content in the DLC film ranged from 0.3 at% to 40 at% by varying the duty ratio of the pulsed voltage applied to the copper target. The graphite structure (sp2 bond) in the Cu-DLC film increased with increasing Cu content. The antimicrobial effect of Cu-DLC on Escherichia coli was examined by the colony-count method. E. coli was inactivated at a Cu content of 0.3 at% and the inactivation rate increased with increasing Cu content. This antimicrobial effect was obtained while maintaining hardness at a low Cu content using dual magnetron sputtering.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.