Abstract
Accurate X-ray diffraction intensity data have been obtained using a spherical single crystal of GaAs at ambient temperature, 298 °K. Least squares refinement of this data yielded the Debye-Waller factors,BGa=0.68±0.05 A2 andBAs=0.42±0.03 A2. The residual index for the discrepancy between measured and calculated structure factors in the present work is quite small, beingR=0.0068. Anharmonic thermal vibration was sought for and found to be negligible. The inclusion of dispersion corrections in the structure factor expressions gives rise to Bijvoet inequality between inverse reflections with the indices all odd. The present work reveals excellent agreement, both in sign and magnitude, of the Bijvoet inequalities for a large number of such reflections. Covalent charge transfer has been deduced from the experimental measurements on a few quasi-forbidden Bragg reflections.
Published Version
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