Abstract
The mechanism of ionic transport in the amorphous anodic film formed on Al–40 at.% Sm alloy has been examined by transmission electron microscopy and Rutherford backscattering spectroscopy. The film consists of an outer layer, about 6% of the total film thickness, composed of relatively pure Sm2O3 and an inner layer containing units of Al2O3 and Sm2O3 distributed homogeneously at the available resolution. The anodic film material is formed by migration of O2−/OH− ions inward and migration of cations outward, with a cation transport number about 0.29. The two-layered film develops as a consequence of faster migration of Sm3+ ions than Al3+ ions in the film.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
