Abstract
We studied the changes of magnetoresistance ratio (MR ratio), exchange bias field ( H ex), and microstructure with annealing in conventional, specular, and dual specular spin valves. MR ratio of conventional spin valve was 7.88% and that of specular spin valve was 11.8% at their optimal annealing conditions. Conventional spin valve had less thermal stability than specular spin valve due to the diffusion mainly of Mn at between 200 and 305 °C. Exchange bias field of both samples was improved rapidly with increasing temperature. Dual specular spin valve showed higher MR ratio than single specular spin valve due to two nano-oxide layers (NOLs) in the top- and bottom-pinned layers.
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