Abstract
We deposited Co x Cr100−x thin films, under vacuum, onto Si (100) substrates; x is the cobalt proportion. The hysteresis loops in the longitudinal and the polar configurations are obtained by means of an alternating gradient field magnetometer (AGFM) at room temperature. The magnetic force microscopy technique is used to observe domain configurations, especially for the thickest films. The magnetic anisotropy of the films is investigated using ferromagnetic resonance (FMR) techniques. The thinnest films do not present any domain configuration whereas the thickest films exhibit clear stripe domains with a period sensibly equal to the film thickness. The magnetic anisotropy constants are computed using the static and the dynamic magnetic studies. The K i values, issued from these techniques, are compared. These results and others are presented and discussed.
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