Abstract

Etching of gallium nitride is a key step in the production of blue and white light‐emitting diodes (LEDs). Etching in aqueous KOH solution creates a rough surface on the LED chip to facilitate outcoupling of the photons generated, drastically increasing the resulting LED's efficiency. Compared with the common technique of dry etching, wet‐chemical etching using aqueous KOH solution has significant advantages, e.g., lower complexity and cost and less remaining surface damage. An in‐depth analysis of the molecular etch reaction by characterization of the reaction products is reported. The mechanism identified explains the cause of anisotropic etching, which leads to the formation of hexagonal pyramids. The concept of hydroxide repulsion by protruding NH and NH2 groups established in the literature is adapted and further developed. The susceptibility of several polar, semipolar, and nonpolar crystal facets may also be explained, as well as the commonly observed increase in average pyramid size over etch time.

Highlights

  • Gallium nitride has been successfully used for the production heat generated by the operating device cannot be dissipated

  • The irradiation wavelength of the laser is chosen to fall between the bandgap energies of the sapphire and GaN to allow light to cross the sapphire substrate and be absorbed by the GaN layer

  • A 15.24 cm GaN wafer was pretreated in buffered oxide etch (BOE) solution to remove Ga and GaOx residues from laser lift off (LLO) and ensure that no side reaction might lead to gas bubble formation on the wafer’s surface

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Summary

Introduction

Gallium nitride has been successfully used for the production heat generated by the operating device cannot be dissipated. Dislocations had no impact during N-polar GaN etching without above-bandgap illumination and without application of bias voltage.[13] Under the same conditions, Ga-polar material generates etch pits at dislocation sites. This phenomenon has frequently been exploited for atomic force microscopy (AFM) analysis of dislocation density.[14]. A different mechanism is conceivable: the field of photoelectrochemical (PEC) etching entails application of above-bandgap illumination and bias voltage.[17] Light illumination generates electron–hole pairs. We build upon the previously reported model of hydroxide repulsion to explain the relative stability of several semipolar and nonpolar crystal facets, including the pyramid side planes formed during N-face GaN etching

Substitution Mechanism under NH3 Formation
Analysis of Reaction Products
Molecular Reaction Mechanism
Characterization of Pyramid Side Facet Species
Selectivity of N-Face over Ga-Face Etching
Stability of Pyramid Side Facets
Stability of Nonpolar Crystal Facets
Instability of Pyramid Tips during Prolonged Etching
Conclusions
Experimental Section
Conflict of Interest
Full Text
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