Abstract
Small-angle X-ray scattering (SAXS) techniques enable convenient nanoscopic characterization for various systems and conditions. Unlike synchrotron-based setups, lab-based SAXS systems intrinsically suffer from lower X-ray flux and limited angular resolution. Here, we develop a two-step retrieval methodology to enhance the angular resolution for given experimental conditions. Using minute hardware additions, we show that translating the X-ray detector in subpixel steps and modifying the incoming beam shape results in a set of 2D scattering images, which is sufficient for super-resolution SAXS retrieval. The technique is verified experimentally to show superior resolution. Such advantages have a direct impact on the ability to resolve finer nanoscopic structures and can be implemented in most existing SAXS apparatuses both using synchrotron- and laboratory-based sources.
Highlights
We show that translating the X-ray detector in subpixel steps and modifying the incoming beam shape results in a set of 2D scattering images, which is sufficient for super-resolution Small-angle X-ray scattering (SAXS) retrieval
As expected, repeating the same experiment with different point-spread function (PSF) sizes while keeping the exposure time constant, we find that the separating criterion δ vanishes when the PSF size approaches the effective pixel size (l/f)
Our results clearly demonstrate the supremacy of the Constrained Multi Deconvolution (CMD) retrievals over a large parameter set, and in particular, for short total exposure times, where our retrieval error is significantly smaller than the unrealistic point-like PSF
Summary
For a set of m measured images, Yi , and their corresponding measured PSF—Pi , where i = 1, . . . , m , our goal is to restore the image as if the PSF was a point source
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