Angular distribution of the soft component of radiation from relativistic electrons near planar orientation in thick single crystals

Abstract

The Tomsk synchrotron has been used to carry out an experimental study of the soft component (ω≲30 MeV) of the radiation from relativistic electrons in diamond, silicon, and tungsten single crystals. It is shown that a component of the radiation associated with channeling emission from electrons trapped inside the crystal can be distinguished because of angular selection. It is found that the linear density of the radiation from the electrons which must be trapped in planar channeling inside the crystal because of multiple scattering is substantially reduced in comparison with the linear density of the radiation from electrons trapped in this regime in the surface layer of the crystal. It is shown that the “quasirefraction” of an electron beam by the planar potential in thick single crystals leads to “effective reflection” of electrons.