Abstract
ABSTRACT The angular distribution of fluorescent L X-rays and Compton-scattering photons was investigated by measuring differential cross sections for high–atomic-number elements. The measurements were taken simultaneously for L X-ray and Compton-scattering photons using Am-241 radioisotope as photon sources and a Si(Li) detector in various emission angles. The measurements confirm well-known angular dependency of the Compton-scattering differential cross section. L X-ray angular distribution measurements were carried out for the Ll, Lα, Lβ, and Lγ lines. It was observed from measured differential cross sections that Ll and Lα X-ray differential cross sections for the L3 substate depended on the emission angle, meaning that Ll and Lα X-rays had an anisotropic spatial distribution. On the other hand, the Lβ and Lγ X-rays do not show any significant anisotropy.
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