Abstract
Empirical mode decomposition (EMD) was used to efficiently distinguish weak random-cavity emission from large broad spontaneous emission of the ZnO bulk and the multiple quantum wells (MQWs) structures. By fast Fourier transforming (FFT) the EMD results, we obtained the optical cavity lengths of random lasing and their corresponding emission intensity. With increasing pumping power, the EMD-FFT method confirms that the nonlinear trend of the random lasing emission in ZnO bulk and the change in optical cavity length is a result of change in refractive index dispersion due to the bandgap renormalization with high excited carrier density in nonpolar a-plane ZnO MQWs.
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