Abstract
Pnp InP/InGaAs heterojunction bipolar transistors have been modeled using a modified Gummel–Poon model, and the results are compared with experimental measurements and results from a commercial simulator. The model provides a good description of the transistor’s high frequency performance and describes the falloff in device performance at high current densities. The model overestimates the current gain at low current densities by neglecting hole recombination in the base side of the emitter–base space charge region.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
