Abstract

In the inductively coupled plasma atomic emission spectrometric analysis of real samples, influences of the matrix on the analyte spectral lines could be expected, especially when the ratio of the concentration of the matrix to that of the analyte is extremely high. In addition to the elimination of stray-light effects by background correction, there are also spectral interferences which must be investigated. It is of great importance to obtain information concerning the spectral line overlaps before setting up an analytical programme. The experiments performed dealt with the interferences to be expected in a Zr matrix. In general, because of the nature of Zr the chemistry and technology associated with this element are very complicated, therefore the methods applied in its analysis have specific requirements. Where possible, for all the analytes of interest (Al, B, Cd, Co, Cr, Cu, Fe, Hf, Mg, Mn, Mo, Nb, Ni, Sn, Ta, V, U and W) spectral lines were selected that were free from interferences caused by the matrix element. Where no interference-free analyte line could be found, it was necessary to perform line interference corrections. The analytical programme developed in this way was tested with Standard Reference Materials (National Institute of Standards and Technology). The data compare well with the certified values. The confidence intervals for 95% probability were in the range of 2–12%, depending on the element and the concentration.

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