Analysis of the Various Effects of Coating W Tips with Dielectric Epoxylite 478 Resin or UPR-4 Resin Coatings under Similar Operational Conditions

Abstract

Abstract: The objective of this work is to study the differences that occur in behavior and properties of the emitted electron beam from tungsten (W) tips before and after coating these tips with a thin layer of a good proven dielectric material. Core metallic tips have been prepared from a polycrystalline (99.995% purity) tungsten (W) wire. Analysis has been carried out for clean W emitters before and after coating these tips with two differences types of epoxy resins; namely: (Epoxylite 478 and UPR-4). For critical comparison and analysis, several tungsten tips with various apex- radii (very sharp) have been prepared with the use of electrochemical etching techniques. The tips have been coated by dielectric thin films of various thicknesses. Their characteristics have been recorded before and after the process of coating. These measurements have included the current-voltage (I-V) characteristics, Fowler-Nordheim (F-N) plots, visible light microscope (VLM) image and scanning electron microscope (SEM) micrographs to measure the influence of the Epoxylite resin coating’s thickness on the tips after coating. Special distributions have been recorded from the phosphorescent screen of a field electron emission microscope as well. Comparing the two sets of composite systems tested under similar conditions has provided several advantages. Recording highly interesting phenomena has produced a wide opportunity to develop a new type of emitter that includes the most beneficial features of both types. Keywords: Cold field emission, Epoxylite 478, Epoxylite UPR-4.