Analysis of the problems of statistical estimations in stochastic sources of discrete electron fluxes

Abstract

Using computer simulation of an experiment on measuring statistical characteristics of electron fluxes, we study the mechanism of appearance of the modulation (in particular multiplicative) noise component due to the discrete nature of electron fluxes in vacuum and analytical devices. It is shown that the presence of both uncorrelated and correlated multiplicative noise in electron devices and inertia of circuits for recording of instantaneous values of the electron current significantly change statistical properties of the measured fluctuation processes. In most cases, the above-mentioned factors can introduce noticeable errors during experimental estimations of statistical distributions in solids, in particular energy distributions of emitted electrons, if the existing measurement techniques are used.