Abstract

This paper presents the full-wave characterization of substrate integrated waveguide structures. Substrate integrated circuits are considered as an ensemble of conducting posts placed in a parallel-plate waveguide and are analyzed in terms of the cavities formed by the top and bottom conducting plates and by the walls of the metallic vias. The field inside the parallel-plate waveguide is computed by considering the dyadic Green's function expressed as an expansion in terms of vectorial cylindrical eigenfunctions and considering the scattering from the ensemble of conducting posts. Coaxial or waveguide ports are included in the analysis as equivalent magnetic current distributions. Self-admittance and mutual admittance are calculated in a form that separates the parallel-plate contribution from the field scattered by the posts. Results relevant to structures already presented in literature will be shown and compared with simulations obtained with one of the most used articles of commercial software. It will be shown that an excellent agreement with published results is achieved together with significant improvements both in computational time and memory requirements.

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