Abstract
After a short description of a model for calculation of element specific linescan intensity profiles measured in an analytical transmission electron microscope on cross-sections of nanoscale multilayers by EDXS and EELS in the STEM mode the essential influences to the results are discussed. Particularly, the signal-to-noise ratio is considered. To confirm the model measured and calculated profiles are compared. Investigations on nanoscale multilayers require a field emission gun and a specimen stage with high stability. Specimen drift can lead to completely confused intensity profiles and has to be avoided or corrected during the measurement.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
