Analysis of multilayer-multiconductor structures on anisotropic substrates using the finite difference method

Abstract

In this paper, the finite difference method (FDM) is employed to study the effects of anisotropy on open, closed, or partially shielded multilayer-multiconductor structures. Effects of tilting the optical axis of the substrate with respect to the axes of the structure are investigated. The method was found to be suitable for the analysis of circuit geometries appearing in microwave integrated circuits (MIC's), printed circuit boards (PCB's) and in surface acoustic wave (SAW) applications for frequencies up to 5, and in some cases, to 10 GHz. >