Analysis of Mode Quality Factors for Equilateral Triangle SemiconductorMicrolasers with Rough Sidewalls

Abstract

The eigenmode characteristics for equilateral triangle resonator (ETR)semiconductor microlasers are analysed by the finite-difference time-domaintechnique and the Padé approximation. The random Gaussian correlationfunction and sinusoidal function are used to model the side roughness of theETR. The numerical results show that the roughness can cause the split ofthe degenerative modes, but the confined modes can still have a high qualityfactor. For the ETR with a 3 µm side length and the sinusoidalfluctuation, we can have a quality factor of 800 for the fundamental modein the wavelength of 1500 nm, as the amplitude of roughness is 75 nm.