Abstract
Abstract The microwave surface resistance and reactance of YBa2Cu3O7 multilayers for MCMs have been studied as a function of thickness and relative permittivity of dielectric layers at 500 MHz and 10 GHz propagation frequency. Additionally, frequency properties of a YBCO/CeO2/SrTiO3/YBCO/LaAlO3 multilayer have been analyzed and results compared with measurement results. Performed simulations have shown that a dielectric layer of high relative permittivity, necessary for good isolation between superconducting ground planes and power planes in the multichip modules, has negligible influence on the effective surface resistance and reactance up to 0.5 μm dielectric thickness.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
