Abstract
We present an integral equation (IE) method for the analysis of electrically large objects which involves the use of the spatial decomposition technique (SDT) and a scheme which we refer to as reduced current fidelity (RCF). We apply SDT/RCF to the analysis of perfectly conducting 2D structures under TM excitation. In the SDT an electrically large structure is decomposed into a set of much smaller subobjects and IE methods are used to determine a solution for each subobject with an account made for the presence of the other subobjects. The method of moments (MoM) is applied for the numerical solution of each subobject in a sequential manner until a solution for every object created from the decomposition is obtained. For electrically large objects, RCF allows for a significant reduction in the solution time and memory in an SDT solution by exploiting the large distance between subobjects.
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