Abstract
Understanding the dissolution kinetics of resist materials is essential for their efficient development. In this study, we investigated the dissolution kinetics of poly(4-hydroxystyrene) (PHS) with a weight-average molecular weight (M w) of 8000–30 000 and a polydispersity index (M w /M n) of 1.07–1.20. The dissolution kinetics of PHS films was observed in tetramethylammonium hydroxide (TMAH) aqueous developers by a quartz crystal microbalance (QCM) method. The TMAH concentration was changed from 0 to 2.38 wt%. The formation of a thick transient swelling layer at these M w /M n values was suppressed compared with that at M w /M n > 2. QCM data were analyzed using the polynomial regression to clarify the effects of M w and M w /M n on the dissolution kinetics in a narrow polydispersity region. Both dissolving and swelling kinetics largely depended on M w/M n. M w had little effect in 2.38 wt% TMAH developer; however, it had a large effect on the swelling when 2.38 wt% TMAH developer was diluted.
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