Abstract
in the present paper the basic concepts of the transmission electron microscopy are outlined. In particular, the relevant aspects of both the kinematical and the dynamical theory of contrast, and their usefulness in the interpretation of the electron micrographs and of the diffraction patterns, are shortly discussed. Among the various examples of application of this technique to the materials science reported in literature, the methods currently employed to characterize, from the electron micrographs, lattice defects in crystalline materials, such as dislocations, loops, stacking faults and twins, are emphasized in this article.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
