Abstract
An analysis is made of the effect of the copper diffusion into semi-insulating undoped GaAs crystals on the intensity of the intrinsic luminescence. It is shown that the copper diffusion into semi-insulating undoped GaAs crystals could lead both to an increase and to a decrease in the intrinsic luminescence intensity. Analytical expressions connecting the value and the sign of the effect observed with the recombination parameters of crystals pointed and also with the intensity of luminescence excitation are obtained.
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