Abstract
Abstract: This paper presents a detailed analysis and the optimization of a very low frequency high-voltage test system for cable tests with test voltages up to 200 kVrms. In the analysis, the limitations of the test system due to the initial hardware setup are discussed. An advanced design is proposed based on a parameter optimization, which enlarges the possible operating range and improves the quality of the test voltage. To further increase the operating range, a new setup of the high-voltage test system is proposed following the ideas of a mechatronic system design.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
