Abstract
This paper reveals the effect of the reverse-recovery current of a PIN diode on the surge and gate-noise voltage of an insulated-gate bipolar transistor (IGBT) in an inverter. Theoretical analysis reveals that the <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"><tex-math notation="LaTeX">$di/dt$</tex-math></inline-formula> of the reverse-recovery current, the switching speed of the IGBT and parasitic inductances affect the gate-noise voltage unlike a Schottky barrier diode (SBD) because resonance does not occur due to junction capacitances. The analysis also indicates that the surge voltage may not occur when the dc voltage is increased even though a large amount of surge voltage occurs in a low dc voltage region. A 1-kV testing setup was designed and constructed using a 1.7-kV 260-A IGBT module, which confirms the validity of the theoretical analysis.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
