Analog circuit fault diagnosis based on RBF

Abstract

Analog circuit fault diagnosis is growing common using techniques based on artificial intelligence (AI). Among these, defect diagnosis based on radial basis function (RBF) has recently received attention and has demonstrated a respectable level of accuracy. This paper's goal is to demonstrate this method's thought process, methodology, and specific actions. Researchers can refer to the reference circuit diagram, experimental table, and analytic process in the publication to evaluate the efficacy of this approach. Additionally, the elements that can be changed and improved upon are highlighted, offering a path for future study.