Abstract
Fourier analyses of both multiple and single-order reflections in FCC (Ag-4.5 at.% Ge) alloy films (68 to 238 nm thick) indicated appreciable coherent domain size and lattice strain effects with slight lattice contraction and significant compressive long-range residual stress. The study further reveals large concentrations of growth twin stacking faults but none that were intrinsic or extrinsic. The films showed a high dislocation density and a strong preferential texture along (111).
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