Abstract
An instrument capable of high-resolution spatial mapping of crystallographic phase, lattice strain, and lattice distortion with x-rays of energies from 6 to 20 keV has been constructed and commissioned at the 2-ID-D. beamline of the Advanced Photon Source. By integrating a hard x-ray Fresnel zone-plate-based microprobe and a six-circle diffractometer, the instrument provides a spatial resolution better than 250 nm, angular resolution of diffractometer circles better than 0.0001°, angular repeatability of the sample circles better than 0.001°, and almost full accessibility to the entire reciprocal space. The microprobe employs 10 cm and 40 cm (focal length at 8 keV) zone plates to provide high and moderate focusing power, respectively. Each zone-plate assembly has two identical zone plates stacked together to provide higher efficiency for higher energy (up to 30 keV) applications. The x-ray diffraction microscope has been applied to studies of the microstructures of bicrystal-supported magnetoresistive films.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
