Abstract

We present the design of a highly compact high field scanning probe microscope (HF-SPM) for operation at cryogenic temperatures in an extremely high magnetic field, provided by a water-cooled Bitter magnet able to reach 38 T. The HF-SPM is 14 mm in diameter: an Attocube nano-positioner controls the coarse approach of a piezoresistive atomic force microscopy cantilever to a scanned sample. The Bitter magnet constitutes an extreme environment for scanning probe microscopy (SPM) due to the high level of vibrational noise; the Bitter magnet noise at frequencies up to 300 kHz is characterized, and noise mitigation methods are described. The performance of the HF-SPM is demonstrated by topographic imaging and noise measurements at up to 30 T. Additionally, the use of the SPM as a three-dimensional dilatometer for magnetostriction measurements is demonstrated via measurements on a magnetically frustrated spinel sample.

Highlights

  • Scanning probe microscopy (SPM) provides a versatile tool for high-resolution imaging

  • We present the design of a highly compact high field scanning probe microscope (HF-scanning probe microscopy (SPM)) for operation at cryogenic temperatures in an extremely high magnetic field, provided by a water-cooled Bitter magnet able to reach 38 T

  • Probes have been developed for atomic force microscopy (AFM) and related SPM techniques at cryogenic temperatures and in magnetic fields,1–4 which have enabled novel properties of magnetic and multiferroic domain walls to be explored

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Summary

INTRODUCTION

Scanning probe microscopy (SPM) provides a versatile tool for high-resolution imaging. It allows spatial features of materials which differ from the bulk by their magnetic, electronic, or other properties to be probed down to nanometer length scales. Since almost all SPM setups to date have utilized laboratory superconducting magnets, the maximum field has been limited to 20 T.3. This leaves many field-induced phase transitions, such as in frustrated spinels and multiferroics, out of reach. We demonstrated a scanning tunneling microscope (STM) capable of operating in a water-cooled Bitter magnet at up to 34 T.14. We demonstrate static and dynamic atomic force microscopy imaging and magnetic force microscopy at fields up to 30 T

INSTRUMENT DESIGN A suite of Bitter magnets are available at the High
Cantilever
Coarse approach and sample scanner
Wiring and electronics
CHARACTERIZATION AND MITIGATION OF BITTER MAGNET NOISE
IMAGING TESTS WITH THE HF-SPM
DILATOMETRY WITH THE HF-SPM
CONCLUSIONS
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